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Test Systems Product List and Ranking from 39 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

Test Systems Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

  1. フクダ Tokyo//Testing, Analysis and Measurement
  2. アンドールシステムサポート 自動テストソリューション事業部 Tokyo//Industrial Electrical Equipment
  3. Semi Next 本社、三重事業所 Tokyo//Electronic Components and Semiconductors
  4. 4 アルファクス Kanagawa//Industrial Electrical Equipment
  5. 5 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社 Tokyo//Testing, Analysis and Measurement
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Test Systems Product ranking

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

  1. Druck 『ADTS 405 MkII』 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社
  2. sCT9002 Silicon Photonics Wafer Test System Semi Next 本社、三重事業所
  3. Automatic Glove Leak Test System "AGLTS" ジャパンマシナリー
  4. Silicon Photonics Wafer Test System 'SWT5100' Yonata Electronics
  5. 4 Burst Test System (Pressure Destruction Testing Device) 日本ハイドロパック

Test Systems Product List

1～30 item / All 111 items

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SIVA Test Framework

SIVA Test Framework

Unifying the semiconductor testing phase to improve work efficiency.

SIVA is a test framework specialized for semiconductor testing. By managing it with a unified framework, it enhances the reusability of programs and enables the development of new tests with reduced time and cost. Testing is conducted under a unified framework from development to production, allowing for high-quality management. At Peritec, we create modular programs using the LabVIEW programming language for each function, build test sequences with TestStand, and further develop a highly functional and extensible test system in a short period through management by SIVA.

  • Integrated operation management
  • Semiconductor inspection/test equipment
  • Software (middle, driver, security, etc.)
  • Test Systems

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V2X HILS Test System

V2X HILS Test System

Development support for virtual construction simulation of transportation infrastructure.

In recent years, the development of fully autonomous vehicles has progressed, making it essential to conduct demonstration experiments in various countries and regions with differing standards and underdeveloped infrastructure. Preliminary verification through field tests involves risks in terms of cost and resources. The V2X HILS testing system virtually constructs traffic infrastructure that does not exist in reality and supports the development of V2X ECUs by simulating various situations, including other vehicles and pedestrians moving within that environment. Peritec provides application development as well as NI products and solutions in the fields of V2X development, testing, and verification.

  • Testing Equipment and Devices
  • Distance measuring device
  • Other environmental analysis equipment
  • Test Systems

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Automatic Glove Leak Test System "AGLTS"

Automatic Glove Leak Test System "AGLTS"

No external piping or compressed air needed! The all-in-one measuring unit is powered by a durable lithium battery.

"AGLTS" is a complete integrity testing system for advanced and automated gloves designed for isolators and RABS in the pharmaceutical industry, following the positive pressure decay method outlined in ISO 14644-7 Annex E.5. With a user-friendly interface, operators can control the inspection unit with simple and easy-to-understand commands. The system status during operation can be continuously monitored at the control station. 【Features】 ■ Easy operation and wearing ■ Autonomous (with built-in pump) ■ Customizable ■ Modular (expandable with multiple units) ■ Wireless communication *For more details, please contact us through [Iprosu Monozukuri] or [Special Site]. *If you are viewing the pharmaceutical and food site or the urban development site, we kindly ask you to download the catalog from [Iprosu Monozukuri] or [Special Site].

  • Testing Equipment and Devices
  • Test Systems

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Mixed Signal Test System SX-3000 Series

Mixed Signal Test System SX-3000 Series

Mixed Signal Test System SX-3000 Series

This is the latest model tester that achieves high throughput with simultaneous measurement of multiple units to meet the demand for reduced testing costs. To improve measurement accuracy, the latest technology has been introduced in detail. In addition to three types of general-purpose probing tailored to various applications, we also offer various power supplies, digital options, and AC options to accommodate a wide range of devices. Furthermore, it is application-compatible with the SX-2100 series, which has been adopted by many customers, allowing for the sharing of test assets.

  • Tester
  • Test Systems

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Burst Test System (Pressure Destruction Testing Device)

Burst Test System (Pressure Destruction Testing Device)

A device that can test the pressure resistance and breaking pressure of containers and valves under high pressure.

The Hydro Pack Burst Test System is a device that can test the pressure resistance and burst pressure of containers and valves under high pressure. The pressure generation system packages a high-pressure pump and pressure measurement devices necessary for testing into a compact cabinet. Additionally, we design and manufacture internal pressure/fatigue cycle tests (examples: 200MPa, 700MPa) based on customer specifications. For more details, please contact us or refer to the catalog.

  • Testing Equipment and Devices
  • Test Systems

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Druck 『ADTS 405 MkII』

Druck 『ADTS 405 MkII』

Air data test set. Fully programmable to match the type of aircraft! Available in flight line type and rack mount type.

The Druck "ADTS 405 MkII" is a highly reliable, high-precision air data test system. With a robust and compact design, it optimizes performance, maintainability, and ease of operation. Fully programmable to accommodate different types of aircraft, it is available in both flight line and rack-mounted configurations. 【Features】 ■ High-precision TERPS sensor suitable for testing RVSM aircraft ■ Flight line and rack-mounted configurations ■ Civilian and military standards ■ Built-in or remote pressure/vacuum supply units ■ Fully programmable to match aircraft types ■ Protection for aircraft instruments ■ Fully compliant with CE and ROHS II *For more details, please refer to the PDF materials or feel free to contact us.

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  • Other information systems
  • Test Systems

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Dielectric test equipment

Dielectric test equipment

We provide systems specialized for testing dielectric materials, ferroelectric materials, piezoelectric materials, smart materials, and various applications.

To reduce the time, effort, and introduction costs for researchers in the fields of ferroelectrics, piezoelectrics, pyroelectrics, and high-voltage dielectrics, we offer a low-cost testing system utilizing refurbished products, backed by a one-year warranty. The main components, such as LCR meters, impedance analyzers, electrometers, and temperature chambers, are sourced from top manufacturers. Depending on your budget, we can combine refurbished products from these manufacturers to achieve greater cost savings. We provide original software and probes tailored to the user's applications. This system is very simple yet significantly contributes to research and development. *This system (equipment + software + fixtures) is a product developed by researchers (PhD) at Pennsylvania State University in the United States, based on needs they experienced during their own research.

  • Other polymer materials
  • Piezoelectric Devices
  • Other measurement, recording and measuring instruments
  • Test Systems

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Electric Calorimetry Direct Test System

Electric Calorimetry Direct Test System

Direct measurement of the heat generation of ECE materials.

1. Directly measures the heat generated from ECE materials. 2. Ensures accurate thermal measurements through an inherently precise calibration process. 3. The integrated sample holder allows for easy switching between calibration and high voltage testing. 4. Protection circuit to safeguard the Stanford Research Systems SR560 preamplifier. 5. A compact heat flux sensor capable of measuring both heat flux and temperature. Extremely small size with minimized thermal mass. Response time: over 0.1 seconds. Thermal resistance: 0.01°F / BTU / ft²-hr; Output signal: >3µV/BTU/ft²-hr; Thermal capacity: 0.02 BTU/ft²/°F. 6. Genuine Stanford Research Systems SR560 preamplifier with wide bandwidth, noise filtering, and gain.

  • Other polymer materials
  • Test Systems

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c-V2X test system

c-V2X test system

"Realizing the development of next-generation vehicles" V2X connects cars with everything. We support the development of safe vehicles by leveraging the potential of V2V and V2I technologies.

The V2X test system supports the development of V2X ECUs through simulations of various situations involving vehicles and pedestrians running in a virtually constructed traffic infrastructure. 【Features】 ■ Verifies the operation of V2X DUT on the PC5 interface, supporting safe vehicle development utilizing V2V and V2I technologies. ■ Supports international standards with V2X extension capabilities, including overseas standards from the United States (WAVE), EU (ITS-G5), and China (CSAE). ■ Provides a software-defined V2X open-loop solution compliant with LTE-Advanced Release 14. ■ Features a software-defined architecture that can accommodate existing wireless standards, GNSS, DSRC, LTE-V2X, 5G V2X, and new wireless standards. ■ Offers effective test sequences and allows users to create their own test scenarios. ■ Provides add-on extension tools. <Examples> - Software-defined GNSS (Global Navigation Satellite System) simulator. - Congestion simulation software that emulates the surrounding environment with up to 100 vehicles. - Channel emulation software that emulates physical distortion radio waves.

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  • Testing Equipment and Devices
  • Test Systems

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Test System for Electric Motors "e.d.c"

Test System for Electric Motors "e.d.c"

We provide a comprehensive solution specialized in functional testing and EoL (End of Line) testing for various types of electric motors.

We handle "Test Systems for Electric Motors." To maintain the high quality of electric motors, which consist of rotors and stators, it is necessary to apply technical methods used in the production process for measurement and inspection. The product lineup from e.d.c. includes systems customized for inline and offline testing that enable various electrical tests during the development and manufacturing stages of electric motors and their components, allowing for the detection of insulation failures. 【Product Lineup】 ■ Stator testers for production lines (winding and hairpin) ■ Test benches for various types of rotors: permanent magnet, re-skewed, and direct winding ■ Automatic EoL motor testers with LOAD/NO LOAD testing ■ Motor load testing and lifespan simulation cycles for laboratories ■ Advanced winding and insulation quality analyzers for laboratories *For more details, please refer to the PDF materials or feel free to contact us.

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  • Testing Equipment and Devices
  • Other motors
  • Other Auto Parts
  • Test Systems

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WL15MV Multi-Test System

WL15MV Multi-Test System

Different tests of different ICs can be executed simultaneously.

In eight multi-stages, different ICs can simultaneously execute different test items for each. To conduct the same experiment with the previous testing method, eight test systems were required, but this test system can achieve it with just one unit. This enables low cost and space-saving.

  • Semiconductor inspection/test equipment
  • Test Systems

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Power semiconductor wafer simultaneous measurement test system

Power semiconductor wafer simultaneous measurement test system

It is possible to measure up to 32 wafers of power semiconductors.

The test box enables simultaneous measurement of power semiconductor wafers, ranging from 1 to a maximum of 32, by combining them with our test system. The test box is compatible with probe cards from other manufacturers, allowing connections with probe cards from different makers. Additionally, the main test system supports up to 2000V/30A, making it ideal for measuring power semiconductors such as IGBTs, FRDs, SBDs, and MOSFETs.

  • Semiconductor inspection/test equipment
  • Test Systems

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Smart Log Pro (with rotating gate)

Smart Log Pro (with rotating gate)

Record resistance, temperature, and relative humidity! Calibrated according to procedures and standards approved by NIST.

"Smart Log Pro (with rotating gate)" is a product that verifies the functionality of operators' wrist straps and footwear, records test results, and manages entry and exit to ESD protected areas. Equipped with a 5-inch touchscreen for color display, it has become easier for users to understand and operate. It tracks and records the performance of ESD wrist straps and footwear, and allows for a software program for testing limits. 【Features】 ■ High-waist rotating entrance gate ■ Creates a test result database for reporting and quality control ■ Tests operators according to each operator's testing requirements ■ Reduces the time spent on testing human grounding devices in ESD management plans ■ Operators can continue testing even if a network malfunction occurs *For more details, please refer to the related link page or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Entrance and exit control system
  • Test Systems

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PXI Automatic Test Solution Seminar

PXI Automatic Test Solution Seminar

This is a seminar introducing the PXI standards and application examples used for automatic measurement in fields such as the automotive industry, aerospace, RF, and HIL testing.

PXI Utilization Guidebook This seminar uses "PXImate" as the seminar text to explain the PXI standard. 【Seminar Content】 1. What is the PXI Standard Explanation of the background and history of the PXI standard, explanation of the PXI chassis, explanation of the PXI hybrid chassis 2. Software for Controlling PXI Self-diagnostic function BIRST, supported OS and development environments, supported drivers 3. What is a PXI Module Explanation of PXI modules, how to choose PXI modules, what the self-diagnostic function BIRST is Overview of Keysight Technologies' measurement modules 4. Case Studies of PXI Utilization in Various Markets Automotive, HILS (Hardware-In-the-Loop-Simulation) Defense, Aerospace, RF, Microwave, Optical Switching 5. Automated Test Solutions Automated test solutions other than the PXI standard (PCI, LXI, GPIB, SIMRC) Application examples combined with JTAG testing

  • Other measurement, recording and measuring instruments
  • Test Systems

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Automated Test System "PXI General Purpose Relay and Switch Module"

Automated Test System "PXI General Purpose Relay and Switch Module"

PXI relay and switch modules with various performance specifications tailored to customer requirements.

The "PXI General-purpose Relay and Switch Module" is a general-purpose module of the PXI solution that allows the construction of automatic measurement systems by combining modules with the necessary functions that comply with the PXI standard. We offer various performance PXI relay and switch modules tailored to customer requirements. 【Features】 ■ PXI relay and switch modules with various performance levels ■ Support for cable assembly to wire modules from Pickering ■ Pickering products come with a 3-year warranty Please contact us for more details.

  • relay
  • Test Systems

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Automated Test System "PXI High-Density General-Purpose Switch Module"

Automated Test System "PXI High-Density General-Purpose Switch Module"

Ruthenium lead relay solutions to maximize signal quality.

The "PXI High-Density General-Purpose Switch Module" is an ideal product for requirements that require many normally open relays. The lead relay module uses relays with ruthenium that exhibit excellent performance with low to medium load contacts. It also provides solutions for mechanical relays that are optimal for high-load applications. We can also accommodate the assembly of connector cables used for wiring between modules. 【Features】 ■ Up to 100 relays per module ■ SPST, DPST, and SPDT configurations ■ Solutions for mechanical relays for high loads ■ 200-pin front panel connector ■ Simple and quick detection of relay anomalies on LXI or PXI switch systems Please contact us for more details.

  • relay
  • Test Systems

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Automated Test System "PXI Power General Purpose Switch Module"

Automated Test System "PXI Power General Purpose Switch Module"

Solutions for lead relays and mechanical relays up to a maximum of 2.5A.

The "PXI Power General-Purpose Switch Module" provides a high current rating in a 3U slot. The relays in the product are carefully selected to ensure long life. Additionally, we also accept assembly of cables for connecting connectors. The version with reed relays uses high-quality relays with ruthenium sputtering, which exhibit excellent contact performance under low and medium load switching conditions. 【Features】 ■ Solutions with reed relays and mechanical relays up to 2.5A ■ Versions available in single pole single throw, single pole double throw, double pole single throw, and double pole double throw ■ Versions with configurations combined with a variety of cell bases ■ Compatible with eBIRST switching system test tools ■ Easily and quickly detect relay anomalies on LXI and PXI switch systems Please contact us for more details.

  • relay
  • Test Systems

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Automated Test System "PXI High-Power General-Purpose Switch Module"

Automated Test System "PXI High-Power General-Purpose Switch Module"

General-purpose switch compatible with eBIRST switching system test tools.

The "PXI High Power General Purpose Switch Module" from Pickering provides relays capable of handling high currents for high power applications. The low current version occupies one 3U size PXI slot, while the high current version occupies two slots. It can be used for switching large AC or DC loads and is ideal for automotive testing systems. Each module features connectors optimized for the application. 【Features】 ■ Mechanical relays and semiconductor relays with current ratings from 1.5A to 40A ■ Single pole single throw, single pole double throw, double pole single throw, and double pole double throw versions ■ High-capacity connectors ■ Module size occupies one or two 3U PXI slots ■ Simple and quick detection of relay anomalies on LXI or PXI switch systems Please contact us for more details.

  • relay
  • Test Systems

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Automated Test System "PXI High Voltage Switch Module"

Automated Test System "PXI High Voltage Switch Module"

High voltage switch compatible with eBIRST switching system test tool.

The "PXI High Voltage Switch Module" is a normally open relay switch module that can handle high voltages up to 1000VAC. Matrix and multiplexer configurations are also available. It is designed to withstand high common mode voltages and uses a protective safety cover to shield the switching components. All modules are equipped with high voltage D-type connectors. 【Features】 ■ Hot switching up to 750VDS or peak 750VAC ■ Cold switching up to 1000VDC or peak 1000VAC ■ Matrix and multiplexer configurations also available ■ Mechanical relay versions can handle up to 5A in hot or cold switching ■ High voltage D-type connectors For more details, please contact us.

  • relay
  • Test Systems

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Automated Test System "PXI Multiplexer Module"

Automated Test System "PXI Multiplexer Module"

PXI multiplexer modules with various performances tailored to customer requirements.

The "PXI Multiplexer Module" is a PXI solution module that combines the necessary functions compliant with the PXI standard to build an automatic measurement system. We offer various performance PXI Multiplexer (MUX) modules tailored to customer requirements. 【Features】 ■ PXI Multiplexer (MUX) modules with various performance levels ■ Support for assembling cables for wiring between Pickering modules ■ Pickering products come with a 3-year warranty ■ Pickering's High Power Multiplexer Model 40-651 is used in aircraft lightning protection tests Please contact us for more details.

  • switch
  • Test Systems

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Automated Test System "PXI Programmable Resistor Module"

Automated Test System "PXI Programmable Resistor Module"

Up to 18 channels! A module ideal for automotive testing.

The "PXI Programmable Resistor Module" is manufactured by Pickering and is an ideal module for testing in medical, aerospace, and automotive applications. It includes a lineup of products such as the "PXI General-Purpose Programmable Resistor" with a minimum resolution of 0.25Ω, the "PXI Selectable Resistor" for applications requiring specific resistance values, and the "PXI Programmable Load Resistor" capable of handling up to 15W. 【Features】 ■ Suitable for medical, aerospace, and automotive applications ■ Resistance range: 1Ω to 16MΩ ■ Up to 18 channels possible in a single PXI/PCI slot ■ Minimum resolution of 2mΩ: 0.03% accuracy ■ Compatible with both PXI chassis and Pickering's LXI chassis For more details, please contact us.

  • Other electronic parts
  • Test Systems

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Automated Test System "PXI General-Purpose Programmable Resistor Module"

Automated Test System "PXI General-Purpose Programmable Resistor Module"

Minimum 0.25Ω resolution! A module ideal for sensor emulation applications.

The "PXI General-Purpose Programmable Resistor Module" features a fine-tuning function with a minimum resolution of 0.25Ω, providing programmable resistors and potentiometers necessary for sensor emulation. By combining two channels, it can be used for potentiometer emulation. We also offer assembly of cables for connecting between modules. 【Features】 ■ Minimum resolution of 0.25Ω, resistance range from 1Ω to 16 MΩ ■ Ideal for sensor emulation applications ■ Individual control of resistance values ■ Compatible with Visa kernel in PXI environment, supports both PXI and LXI chassis ■ Pickering products come with a 3-year warranty For more details, please contact us.

  • Other electronic parts
  • Test Systems

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Automated Test System "PXI High-Precision Programmable Resistor Module"

Automated Test System "PXI High-Precision Programmable Resistor Module"

Minimum 2mΩ resolution! A module with very high accuracy and stability of at least 0.03%.

The "PXI High-Precision Programmable Resistor Module" is manufactured by Pickering and is an ideal module for testing in medical, aerospace, and automotive applications. You can freely select resistance values from the range specified by the product using software. It is designed to easily connect a DMM for resistance verification and is less susceptible to thermal electromotive force effects. Modules that simulate RTDs (Resistance Temperature Detectors) and strain gauges are also available. 【Features】 ■ Extremely high accuracy and stability with a minimum of 0.03% ■ Minimum resolution of 2mΩ ■ Ideal for sensor emulation applications ■ Compatible with Visa kernel in PXI environments ■ Compatible with PXI chassis and LXI chassis Please contact us for more details.

  • Other electronic parts
  • Test Systems

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[Case Study] Adoption of JTAG Testing for LTE Measurement Device Inspection

[Case Study] Adoption of JTAG Testing for LTE Measurement Device Inspection

High-performance, high-quality measurement supported by JTAG boundary scan testing!

We would like to introduce a customer who has implemented "JTAG Boundary Scan Testing" for the inspection of LTE measurement devices. By adopting this product, it has become possible to reliably detect solder defects and pattern defects that cannot be identified through X-ray inspection using electrical testing. Additionally, systems that combine large-scale FPGAs and DDR memory were unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. However, by adopting this product, we were able to improve manufacturing quality. 【Case Study】 ■ Anritsu Corporation - Engaged in the field of information and communication, providing measurement solutions globally. ■ Challenges - Unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices
  • Test Systems

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[Case Study] Adoption of JTAG Testing for Inspection of Implementation Boards

[Case Study] Adoption of JTAG Testing for Inspection of Implementation Boards

Identify defective areas of BGA-mounted boards at the pin level to improve manufacturing quality!

We would like to introduce a customer who adopted "JTAG boundary scan testing" for failure analysis of BGA-mounted boards. After the introduction of our product, sufficient quality assurance can be achieved even for high-density printed circuit boards equipped with numerous BGA packages. 【Case Study】 ■ Saksa Tech Co., Ltd. Production Technology Department - Manufacturing focused on business phones and IC card reader-related products ■ Challenges - Unable to sufficiently establish test pins due to the large number of BGAs - Unable to adequately identify the cause of defects through functional testing - X-ray inspection cannot determine BGA open failures *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices
  • Test Systems

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[Case Study] Adoption of JTAG Testing for Tascam Products Inspection

[Case Study] Adoption of JTAG Testing for Tascam Products Inspection

JTAG boundary scan testing that improved reliability in the early stages of development!

We would like to introduce a case study of a customer who adopted "JTAG boundary scan testing" in the production line of their in-house developed products. For devices compatible with JTAG that are packaged in BGA format, the basic wiring checks are confirmed through JTAG testing before being handed over to the firmware team for boards that consist of DSP (CPU) + RAM + ROM. This approach eliminates wasted development time due to defects in board or component implementation, thereby improving development efficiency. [Case Study] ■ TEAC Corporation, Audio Equipment Division - Development and sales of audio equipment ■ JTAG testing is conducted from the prototype stage to enhance development efficiency. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices
  • Test Systems

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[Case Study] Achieving Quality Assurance for BGA Assembly by Adopting JTAG Testing

[Case Study] Achieving Quality Assurance for BGA Assembly by Adopting JTAG Testing

Feedback the statistical data of BGA defects to manufacturing!

We would like to introduce a case study of a customer who identified defective areas on a BGA implementation board using "JTAG boundary scan testing." By utilizing this product, it became possible to pinpoint the locations of BGA implementation defects at the pin level. A cross-sectional analysis conducted with a microscope on the pins where defects occurred revealed that the cause of the implementation defects was due to the soldering areas being exposed to high temperatures for an extended period. Additionally, by reviewing the temperature management of the solder reflow process, we were able to improve the implementation quality of the board. [Case Study] ■ Oki Electric Communication Systems Co., Ltd. - Mechatronics and electronics design and production contract services ■ Quality assurance of BGA implementation using JTAG testing *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices
  • Test Systems

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[Example] ECU Failure Simulation

[Example] ECU Failure Simulation

Conducting tests to improve the safety of automotive equipment with the "PXI automatic test solution"!

We would like to introduce a case where a French automotive testing equipment system integrator adopted the "PXI Automatic Test Solution." This solution allows for the easy construction of HILS testing systems, simulating system failures to achieve design and functional evaluations of ECUs. The company has successfully automated the testing of in-vehicle devices, resulting in the miniaturization of traditional large-scale equipment and cost reduction. 【Automation of In-Vehicle Device Testing】 ■ Engine Control Unit ■ Powertrain Control Module ■ Engine Control Module ■ Body Control Unit ■ Battery Management Unit *For more details, please refer to the PDF document or feel free to contact us.

  • Other network tools
  • Test Systems

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PXI & LXI Automated Test Learning Center (Seminar)

PXI & LXI Automated Test Learning Center (Seminar)

This is a series of seminars introducing an overview and application examples of automatic measurement, which is gaining attention in fields such as the automotive industry, aerospace, RF, and HIL testing.

We will introduce a method to "automate" verification tasks using PXI & LXI, which are widely used to automate measurements and tests performed "manually" in the field of hardware and software development of overseas electronic devices. It is available for viewing on demand, so you can watch it immediately.

  • Other electronic measuring instruments
  • Test Systems

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Supports boards with BGA! 【JTAG Test Application Case Collection】

Supports boards with BGA! 【JTAG Test Application Case Collection】

This is a collection of case studies on JTAG testing that led to improvements in quality and enhancements in testing scope.

JTAG boundary scan is a testing method that allows for easy implementation testing of boards with BGA components. It has various advantages, and I believe we can gain insights from the case studies. [Case Studies] - Azbil Corporation: Reduced untested areas with JTAG testing, providing peace of mind to customers! - Anritsu Corporation: JTAG testing supports high-performance and high-quality measurements! - Oki Electric Communication Systems: Achieved BGA implementation assurance through JTAG testing. - Konica Minolta Electronics: Established a consistent and advanced inspection system for high-density implementations. - Saksa Tech: Improved manufacturing quality by pinpointing defects on BGA boards at the pin level. - TEAC Corporation: Enhanced reliability in the early stages of development with JTAG testing. *The company names mentioned in the case studies are as they were at the time permission was granted for the introduction.*

  • Circuit Board Inspection Equipment
  • Test Systems

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